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Tester Electrical Interfaces

The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.

Below are our most popular electrical interfaces.

Interfaces-CentaurTM PPR
 

CentaurTM PPR Product Line

The inTEST EMS Centaur Modular Interface provides outstanding signal fidelity. Its modular design lets you economically match upgrades in your tester technology — without replacing an entire interface. Its unique mix of select, standardized components and flexible configuration options evolves over time to keep pace with your changing test requirements. As tester pin count increases, you can increase the number of signal modules without changing hardware. And as you add additional test instruments you simply add the appropriate Transpar Signal or Power Module and you’re ready to test — again, without major changes to the hardware.
inFLEX-PPRs
 

inFLEXTM PPR Product Line

inFlex is mechanically and electrically compatible with the OEM offering. Unlike the OEM version, the inFLEX PPR series uniquely offers true modular construction that allows pins to be removed without losing alignment.

Each module has internal guide shims that keep the probes in alignment even when the outer cap is removed. This greatly speeds changing a damaged or contaminated probe. 

Probe Pin Rings (PPRs) are available in the 300mm probe card size with both standard and increased applications space frames. For 440mm applications, the standard and “J” type frames are available with up to 6,400 probes. The PPR is configurable in 200 pin modules.

standard-ppr
 

12" Standard PPR Product Line

First appearing on the Teradyne J750 semiconductor test platform, the 12” general purpose Probe Pin Ring (PPR) is one of the most used interfaces in the semiconductor industry. Initially offering up to 2,992 pins in 8 segments, inTEST EMS introduced the ‘High Pin Count’ version with 5,848 probes in 2008. The increased probe count and many variations of the mounting frames have made this series the industry favorite for a low-cost probe interface. inTEST EMS PPRs feature integral cam ramps for use with the inTEST EMS manual test adapter. This PPR is designed for tri-temp testing and has been used on a multitude of test systems.
Interfaces-High Power Switch Wafer
 

High Power Switch Wafer Test Interface

The rapid adoption of Electrical Vehicles, Renewable Power, and other High-Power opportunities have transformed the high-power semiconductor device industry. Requirements for high volume testing have forced the industry to adopt new high parallel, cost-effective and optimized test platforms to meet the performance, time to market, and financial requirements of today’s high-power devices.

The High-Power Pogo Ring has up to 8 modules of 50 probes, and each probe is rated for 5 Amps DC. The probe pin ring has been successfully used at 3KV/300AMP.

High-Power-Test-Interface
 

High Power Test Interface Solutions

The rapid adoption of Electrical Vehicles, Renewable Power, and other High-Power opportunities have transformed the high-power semiconductor device industry. Requirements for high volume testing has forced the industry to adapt.  High parallel, cost-effective and optimized test platforms are being introduced to meet the performance and time to market for today's competitive environment.

The high-power test platform for tomorrow’s test floor must achieve high power testing with more efficiency. The inTEST EMS Interface is designed to optimize your ATE performance.

The inTEST EMS High Power Test Interface has up to 16 modules at 50 probes per module. Each probe is rated for 5 Amps DC. The probe pin ring has been successfully used at 3KV/300A.

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